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• W2052040892 abstract "This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality." @default.
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• W2052040892 date "2010-01-01" @default.
• W2052040892 modified "2023-10-01" @default.
• W2052040892 title "(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems" @default.
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• W2052040892 doi "https://doi.org/10.1109/delta.2010.67" @default.
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