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- W2052672989 abstract "ABSTRACT The optical characteristics of substrates are the essential content of research work for thin film optics. The spectrophotometer is one of the important instruments to test transmittance and reflectance of different substrates or coating components. The test accuracy of transmission spectrum of the substrates has direct influenced on optical constants reverse engineering of thin film on the substrate. In this paper, SCHOTT grade LITHOSIL_Q0 fused silica substrate was chosen as standard substrate and was tested transmission spectrum in region 380nm-860nm to use the Lambda-900 spectrophotometer. By comparing the measured transmission spectrum with standard SCHOTT grade LITHOSIL_Q0 fused silica substrate transm ission spectrum can be calculated measur ed errors. In the experiments, the orthogonal experimental design method is used. Sample pool aperture, scan speed, slit width and sampling data interval operating parameters were chosen as key factors (three levels were chosen in each factor). L" @default.
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- W2052672989 date "2010-05-13" @default.
- W2052672989 modified "2023-09-26" @default.
- W2052672989 title "Optimizing operating parameters of spectrophotometer for testing transmission spectrum of optical substrate" @default.
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- W2052672989 doi "https://doi.org/10.1117/12.866185" @default.
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