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• W2053961581 abstract "Abstract We present the results of experiments measuring the film thickness dependence of the sticking probability for H on thin films of superfluid4He for H atom temperatures of 0.3–4.0 mK. Data is presented for 0.6 nm to 1 mm thick films on a silver sinter substrate. For the 0.3 mK H atoms, the sticking probability varies from 0.7 for a film 0.6 nm thick to 2×10-2 for films thicker than 1 μm. Our data are in reasonable agreement with recent theoretical calculations." @default.
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• W2053961581 date "1994-02-01" @default.
• W2053961581 modified "2023-09-29" @default.
• W2053961581 title "Surface reflection of submillikelvin atomic hydrogen from thin superfluid4He films: Substrate effects" @default.
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• W2053961581 doi "https://doi.org/10.1016/0921-4526(94)90338-7" @default.
• W2053961581 hasPublicationYear "1994" @default.
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