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- W2054316399 abstract "Transmittance, Refractive Index, Absorption coefficient, Real and Imaginary part of complex dielectric permittivity data for several Silicon, Silicon Carbide, Gallium Arsenide, Cadmium Telluride and Copper Indium Selenide specimens were measured using Dispersive Fourier Transform Spectroscopy and Free Space Quasi-optical Spectrometer powered by several Backward Wave Oscillators for the characterization of photovoltaic cell materials at Millimeter and THz Waves. Precision measurements easily identifies impurities present in these materials. Data for several silicon carbide (SiC) specimens and powdered Cadmium Telluride specimen over a broad millimeter wave range are shown." @default.
- W2054316399 created "2016-06-24" @default.
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- W2054316399 date "2011-10-01" @default.
- W2054316399 modified "2023-09-25" @default.
- W2054316399 title "Dielectric measurements and characterization of impurities of photovoltaic cell materials at millimeter and THz waves" @default.
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- W2054316399 doi "https://doi.org/10.1109/irmmw-thz.2011.6104890" @default.
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