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- W2055069737 abstract "A new low-voltage high-current column with a Schottky emission gun is presented, which generates an electron probe of 1 keV energy, 20 nA probe current and 50 nm in diameter. Additionally, the secondary electron detection is uniform for a large scan field which makes this column very suitable for wafer inspection and fast electron-beam testing of integrated circuits. A “low-voltage booster” is proposed which can be adapted to a conventional medium-voltage scanning electron microscope to improve its resolution for low-voltage operation. These new systems are compared with other existing low-voltage columns and components, and some principles of low-voltage electron optics are discussed." @default.
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- W2055069737 date "1995-09-01" @default.
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- W2055069737 title "Low-voltage probe forming columns for electrons" @default.
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- W2055069737 doi "https://doi.org/10.1016/0168-9002(95)00254-5" @default.
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