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• W2055369575 abstract "Light scattering caused by imperfections of optical components can critically affect the performance of optical systemsin terms of losses and image degradation. Because of the numerous potential sources of scattering such as roughness,surface and sub-surface defects, bulk inhomogeneities, as well as coatings, scattering properties must be carefullyspecified and measured at the wavelengths of application. Bidirectional Reflectance and Transmittance DistributionFunctions (BRDF / BTDF) are used to quantify the angle resolved scattering properties. The data can be used as an inputfor optical engineering software just as FRED, ASAP, ZEMAX for stray light modeling. In addition, analyzing thescattered light can provide valuable information about the relevant imperfections. The presentation provides an overviewof instrumentation for light scattering measurements at wavelengths ranging from the visible to the extreme ultravioletand the infrared spectral regions. Examples of applications will be discussed ranging from superpolished mirrors todiffraction gratings, interference coatings, and black absorbing coatings." @default.
• W2055369575 created "2016-06-24" @default.
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• W2055369575 date "2014-11-05" @default.
• W2055369575 modified "2023-09-23" @default.
• W2055369575 title "Light scattering characterization of optical components: BRDF, BTDF, and scatter losses" @default.
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• W2055369575 doi "https://doi.org/10.1117/12.2071908" @default.
• W2055369575 hasPublicationYear "2014" @default.
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