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- W2056434408 abstract "The effect of thermal resistans on I C - V BE fly-back characteristic of power SiGe heterojunction bipolar transistor is studied through theoretical analysis, computer simulations, and experimental measurements. It is found that a suitable thermal resistans can make the collector current achieve the second fly-back point before transistors are burned-out, and then returns to a stable situation. Such a thermal resistans is beneficial to the thermal stability. When the thermal resistans is small, the curve of I C - V BE fly-back characteristic of HBT has no fly-back point. While the thermal resistans increases, the curve of I C - V BE fly-back characteristic of HBT has two fly-back points." @default.
- W2056434408 created "2016-06-24" @default.
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- W2056434408 date "2014-12-01" @default.
- W2056434408 modified "2023-09-27" @default.
- W2056434408 title "The Effect of Thermal Resistans on <i>I</i><sub>C</sub>-<i>V</i><sub>BE</sub> Fly-Back Characteristic of Power SiGe Heterojunction Bipolar Transistor" @default.
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- W2056434408 doi "https://doi.org/10.4028/www.scientific.net/amm.701-702.1177" @default.
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