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• W2056557323 abstract "The mobility and thermopower of a 2DEG are calculated in order to explain measurements in two Si-MOSFETs. In one of the samples at T 1016 m-2, positive thermopowers have been measured. The change of sign in the thermopower is attributed to the dominance of interface roughness scattering. Simultaneous consideration of two transport properties indicates the inadequacy of the current theory of interface roughness to explain electron scattering by interface irregularities in one of the samples. At T>2 K, thermopower is explained by phonon drag and good agreement is found between theory and experiment." @default.
• W2056557323 created "2016-06-24" @default.
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• W2056557323 date "1994-04-04" @default.
• W2056557323 modified "2023-09-23" @default.
• W2056557323 title "The effect of interface roughness on the transport properties of a two-dimensional electron gas in a Si-MOSFET" @default.
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• W2056557323 doi "https://doi.org/10.1088/0953-8984/6/14/009" @default.
• W2056557323 hasPublicationYear "1994" @default.
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