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- W2057362142 abstract "Abstract CdS films were prepared by vacuum evaporation. X-ray diffraction was used to analyze the crystal structure of CdS films. Only hexagonal phase with the preferred orientation of the (0 0 2) plane was found in CdS films. The in-plane and transverse resistivities were measured. The value of in-plane resistivities is in the range of 0.333 – 18.9 Ω cm at room temperature. The value of transverse resistivities was about 8 orders more than that of in-plane resistivities. The relationship between the in-plane resistivity and the substrate temperature was different from that of the transverse resistivity and the substrate temperature. The in-plane resistivity of CdS films had a minimum at the substrate temperature of 150 °C, while the transverse resistivity of CdS films had the maximum at the substrate temperature of 150 °C." @default.
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- W2057362142 date "2005-07-01" @default.
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- W2057362142 title "The difference between the transverse and in-plane resistivity of vacuum evaporated cadmium sulfide (CdS) thin films" @default.
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- W2057362142 doi "https://doi.org/10.1016/j.vacuum.2005.01.004" @default.
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