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- W2057754346 abstract "An automated technique for measuring capacitance and conductance of semiconductor devices over a wide frequency range (50 Hz-1 MHz) has been developed. Measurement accuracies are demonstrated to be within 1% of capacitance and 2% of conductance in the frequency range 50 Hz to 300 KHz. Bias levels can be programmed automatically by a digital to analogue converter from -10 V to +10 V." @default.
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- W2057754346 date "1980-03-01" @default.
- W2057754346 modified "2023-09-25" @default.
- W2057754346 title "A new technique for automatic C-V and G-V measurements" @default.
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- W2057754346 doi "https://doi.org/10.1088/0022-3735/13/3/020" @default.
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