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- W2057769023 abstract "Rapid and accurate on-wafer measurements are essential to the affordable manufacture of large volumes of monolithic microwave integrated circuits (MMICs). The purposes of this paper are to compare published on-wafer scattering (S) parameter and waveform measurement methods, identify those that are most useful for particular applications, and discuss probable future directions. Methods discussed include all-electronic measurements with coplanar waveguide (CPW) and magnetic proximity probes as well as combination electronic and optical techniques using picosecond pulsed lasers." @default.
- W2057769023 created "2016-06-24" @default.
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- W2057769023 date "1990-11-01" @default.
- W2057769023 modified "2023-09-27" @default.
- W2057769023 title "On-Wafer S-Parameter and Waveform Measurements" @default.
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- W2057769023 doi "https://doi.org/10.1109/arftg.1990.324004" @default.
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