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- W2058744218 abstract "Microprocessor system failures due to memory corruption by single event upsets (SEUs) and/or latch-up in RAM or ROM memory are common in environments where there is high radiation flux. Traditional methods to harden microcomputer systems against SEUs and memory latch-up have usually involved expensive large scale hardware redundancy. Such systems offer higher reliability, but they tend to be more complex and non-standard. At the Space Astronomy Laboratory we have developed general programming techniques for producing software which is resistant to such memory failures. These techniques, which may be applied to standard off-the-shelf hardware, as well as custom designs, include an implementation of our Maximally Redundant Software (MRS) model, error detection algorithms and memory verification and management." @default.
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- W2058744218 date "1986-01-01" @default.
- W2058744218 modified "2023-10-17" @default.
- W2058744218 title "Techniques to Maximize Software Reliability in Radiation Fields" @default.
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- W2058744218 doi "https://doi.org/10.1109/tns.1986.4334544" @default.
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