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- W2059175336 abstract "Configurationally bistable defects can exist in either of two different structural configurations for the same charge state. Each configuration exhibits distinct optical and electronic properties. Here a framework is presented for the use and interpretation of deep level capacitance transient spectroscopy measurements in the study of these defects. Examples are presented for the MFe center in InP, a bistable A-center-related defect in Si, and the EL2 center in GaAs." @default.
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- W2059175336 date "1985-10-01" @default.
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- W2059175336 title "Capacitance transient analysis of configurationally bistable defects in semiconductors" @default.
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- W2059175336 doi "https://doi.org/10.1063/1.335892" @default.
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