Matches in SemOpenAlex for { <https://semopenalex.org/work/W2059444897> ?p ?o ?g. }
- W2059444897 endingPage "1934" @default.
- W2059444897 startingPage "1915" @default.
- W2059444897 abstract "This review paper presents the applications of X-ray diffraction to routine measurements and the procedures for extending its capabilities of analysis to undertake a detailed structural investigation of low-dimensional structures. The uses and limitations of the familiar double-crystal diffractometer are discussed as are the advantages of 'reciprocal space mapping' with a multiple-crystal diffractometer. In general X-ray diffraction has been used for composition and thickness measurement in low-dimensional structures (LDS) and these aspects are covered, as well as the avoidance of the pitfalls associated with their determination. The possibilities for the use of X-ray diffraction methods to determine interface quality, the evolution of lattice relaxation, the detailed microstructure, etc, are discussed, with an indication of the limits of the techniques." @default.
- W2059444897 created "2016-06-24" @default.
- W2059444897 creator A5089591115 @default.
- W2059444897 date "1993-11-01" @default.
- W2059444897 modified "2023-10-16" @default.
- W2059444897 title "X-ray diffraction from low-dimensional structures" @default.
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