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- W2060159464 abstract "This brief presents a wide-range temperature sensor with process compensation and nonlinear calibration for HV chip thermal monitoring. Due to a high supply voltage and a large current, HV chips are prone to overheating; thus, they require on-chip temperature sensors to monitor thermal variation. The voltage difference between the drain and source voltages of a metal–oxide–semiconductor, i.e., ${V}_{rm DS} $ , of HV devices is enlarged by high supply voltages, causing a severe channel length modulation effect to jeopardize the linearity of the saturation current. The proposed calibrated temperature sensors in this brief provide a nonlinear calibration function to resolve this problem. Moreover, our design reveals a process compensation capability by the proposed process variation canceler. The maximal deviation in the range of $(-40 ^{circ}hbox{C}, +150) ^{circ}hbox{C}$ is measured to be $-2.05 ^{circ}hbox{C}$ – $+2.06 ^{circ}hbox{C}$ ." @default.
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- W2060159464 date "2015-03-01" @default.
- W2060159464 modified "2023-10-17" @default.
- W2060159464 title "Analysis of Calibrated On-Chip Temperature Sensor With Process Compensation for HV Chips" @default.
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- W2060159464 doi "https://doi.org/10.1109/tcsii.2014.2362734" @default.
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