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- W2060484333 abstract "All aspects of the radiation-induced surface conductivity in polymers are discussed with specific emphasis on the role of the bulk processes during these measurements and possible side effects connected with low-energy secondary electrons. It is proved experimentally (single 0.3 ms pulses of 65 keV electrons in vacuum) that the conventional scheme of surface conductivity measurements is especially sensitive to secondary electrons and, in fact, is fully controlled by secondary emission. A four-probe technique proposed in this work totally eliminates both these factors (bulk contribution as well as secondary emission). Conformal mapping is used to predict the electric field distribution in this geometry and, in particular, across the gap between the source and drain electrodes.Alle Aspekte der strahlungsinduzierten Oberflachenleitfahigkeit in Polymeren werden unter besonderer Berucksichtigung der Rolle der Volumenprozesse wahrend dieser Messungen und moglichen mit niederenergetischen Sekundarelektronen verknupften Nebeneffekten diskutiert. Es wird experimentell gepruft (Einzelimpulse (0,3 ms) von 65 keV-Elektronen im Vakuum), das die konventionelle Methode der Oberflachenleitfahigkeitsmessungen besonders empfindlich gegenuber Sekundareelektronen ist und tatsachlich vollstandig von der Sekundaremission gesteuert wird. Eine Vierspitzenmethode, die vorgeschlagen wird, eleminiert diese beiden Faktoren vollstandig (Volumenbeitrag und Sekundarelektronenemission). Konforme Abbildung wird benutzt, um die elektrische Feldverteilung in dieser Geometrie und speziell innerhalb des Bereichs der Quellen- und Senkenelektrode vorherzusagen." @default.
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- W2060484333 date "1984-12-16" @default.
- W2060484333 modified "2023-09-27" @default.
- W2060484333 title "Concerning the radiation-induced surface conductivity in polymers" @default.
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- W2060484333 doi "https://doi.org/10.1002/pssa.2210860230" @default.
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