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• W2060750107 endingPage "2520" @default.
• W2060750107 startingPage "2512" @default.
• W2060750107 abstract "Abstract Accurate age modeling, and fast, yet robust reliability sign-off emerged as mandatory constraints in Integrated Circuits (ICs) design for advanced process technology nodes. In this paper we introduce a novel method to assess and predict the circuit reliability at design time as well as at run-time. The main goal of our proposal is to allow for: (i) design time reliability optimization; (ii) fine tuning of the run-time reliability assessment infrastructure, and (iii) run-time aging assessment. To this end, we propose to select a minimum-size kernel of critical transistors and based on them to assess and predict an IC End-Of-Life (EOL) via two methods: (i) as the sum of the critical transistors end-of-life values, weighted by fixed topology-dependent coefficients, and (ii) by a Markovian framework applied to the critical transistors, which takes into account the joint effects of process, environmental, and temporal variations. The former model exploits the aging dependence on the circuit topology to enable fast run-time reliability assessment with minimum aging sensors requirements. By allowing the performance boundary to vary in time such that both remnant and nonremnant variations are encompassed, and imposing a Markovian evolution, the probabilistic model can be better fitted to various real conditions, thus enabling at design-time appropriate guardbands selection and effective aging mitigation/compensation techniques. The proposed framework has been validated for different stress conditions, under process variations and aging effects, for the ISCAS-85 c499 circuit, in PTM 45 nm technology. From the total of 1526 transistors, we obtained a kernel of 15 critical transistors, for which the set of topology dependent weights were derived. Our simulation results for 15 critical transistors kernel indicate a small approximation error (i.e., mean smaller than 15% and standard deviation smaller than 6%) for the considered circuit estimated end-of-life (EOL), when comparing to the end-of-life values obtained from Cadence simulation, which quantitatively confirm the accuracy of the IC lifetime evaluation. Moreover, as the number of critical transistors determines the area overhead, we also investigated the implications of reducing their number on the reliability assessment accuracy. When only 5 transistors are included into the critical set instead of 15, which results in a 66% area overhead reduction, the EOL estimation accuracy diminished with 18%. This indicates that area vs. accuracy trade-offs are possible, while maintaining the aging prediction accuracy within reasonable bounds." @default.
• W2060750107 created "2016-06-24" @default.
• W2060750107 creator A5034725791 @default.
• W2060750107 creator A5057424352 @default.
• W2060750107 date "2014-06-01" @default.
• W2060750107 modified "2023-09-23" @default.
• W2060750107 title "Critical transistors nexus based circuit-level aging assessment and prediction" @default.
• W2060750107 cites W1529803699 @default.
• W2060750107 cites W1565230778 @default.
• W2060750107 cites W1968716099 @default.
• W2060750107 cites W1983187319 @default.
• W2060750107 cites W1991431227 @default.
• W2060750107 cites W2003588010 @default.
• W2060750107 cites W2038381734 @default.
• W2060750107 cites W2042420141 @default.
• W2060750107 cites W2043496087 @default.
• W2060750107 cites W2045220410 @default.
• W2060750107 cites W2074054045 @default.
• W2060750107 cites W2087656613 @default.
• W2060750107 cites W2095077328 @default.
• W2060750107 cites W2100661413 @default.
• W2060750107 cites W2102729267 @default.
• W2060750107 cites W2113728962 @default.
• W2060750107 cites W2125169487 @default.
• W2060750107 cites W2138019504 @default.
• W2060750107 cites W2138228305 @default.
• W2060750107 cites W2144136778 @default.
• W2060750107 cites W2158748535 @default.
• W2060750107 cites W2158812231 @default.
• W2060750107 cites W2161082510 @default.
• W2060750107 cites W2266447120 @default.
• W2060750107 cites W2548201356 @default.
• W2060750107 cites W2798814333 @default.
• W2060750107 cites W3143610959 @default.
• W2060750107 cites W581425779 @default.
• W2060750107 doi "https://doi.org/10.1016/j.jpdc.2013.08.006" @default.
• W2060750107 hasPublicationYear "2014" @default.
• W2060750107 type Work @default.
• W2060750107 sameAs 2060750107 @default.
• W2060750107 citedByCount "1" @default.
• W2060750107 countsByYear W20607501072015 @default.
• W2060750107 crossrefType "journal-article" @default.
• W2060750107 hasAuthorship W2060750107A5034725791 @default.
• W2060750107 hasAuthorship W2060750107A5057424352 @default.
• W2060750107 hasConcept C119599485 @default.
• W2060750107 hasConcept C127413603 @default.
• W2060750107 hasConcept C148609458 @default.
• W2060750107 hasConcept C149635348 @default.
• W2060750107 hasConcept C165801399 @default.
• W2060750107 hasConcept C172385210 @default.
• W2060750107 hasConcept C41008148 @default.
• W2060750107 hasConceptScore W2060750107C119599485 @default.
• W2060750107 hasConceptScore W2060750107C127413603 @default.
• W2060750107 hasConceptScore W2060750107C148609458 @default.
• W2060750107 hasConceptScore W2060750107C149635348 @default.
• W2060750107 hasConceptScore W2060750107C165801399 @default.
• W2060750107 hasConceptScore W2060750107C172385210 @default.
• W2060750107 hasConceptScore W2060750107C41008148 @default.
• W2060750107 hasIssue "6" @default.
• W2060750107 hasLocation W20607501071 @default.
• W2060750107 hasOpenAccess W2060750107 @default.
• W2060750107 hasPrimaryLocation W20607501071 @default.
• W2060750107 hasRelatedWork W2271776342 @default.
• W2060750107 hasRelatedWork W2530742344 @default.
• W2060750107 hasRelatedWork W2748952813 @default.
• W2060750107 hasRelatedWork W2885513359 @default.
• W2060750107 hasRelatedWork W2899084033 @default.
• W2060750107 hasRelatedWork W2965101536 @default.
• W2060750107 hasRelatedWork W2991202600 @default.
• W2060750107 hasRelatedWork W3117832639 @default.
• W2060750107 hasRelatedWork W3121214617 @default.
• W2060750107 hasRelatedWork W3126909309 @default.
• W2060750107 hasVolume "74" @default.
• W2060750107 isParatext "false" @default.
• W2060750107 isRetracted "false" @default.
• W2060750107 magId "2060750107" @default.
• W2060750107 workType "article" @default.