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• W2061074958 abstract "This paper considers the long-standing problem of conducting fault-injections experiments to establish the ultra-reliability of embedded systems. There have been extensive efforts in fault injection, and this paper offers a partial summary of the efforts, but these previous efforts have focused on realism and efficiency. Fault injections have been used to examine diagnostics and to test algorithms, but the literature does not contain any framework that says how to conduct fault-injection experiments to establish ultra-reliability. A solution to this problem integrates field-data, arguments-from-design, and fault-injection into a seamless whole. The solution in this paper is to derive a model reduction theorem for a class of semi-Markov models suitable for describing ultra-reliable embedded systems. The derivation shows that a tight upper bound on the probability of system failure can be obtained using only the means of system-recovery times, thus reducing the experimental effort to estimating a reasonable number of easily-observed parameters. The paper includes an example of a system subject to both permanent and transient faults. There is a discussion of integrating fault-injection with field-data and arguments-from-design." @default.
• W2061074958 created "2016-06-24" @default.
• W2061074958 creator A5013545199 @default.
• W2061074958 date "2012-10-01" @default.
• W2061074958 modified "2023-09-23" @default.
• W2061074958 title "Designing fault-injection experiments for the reliability of embedded systems" @default.
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• W2061074958 doi "https://doi.org/10.1109/dasc.2012.6382447" @default.
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