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- W2061336369 abstract "Abstract The potential for creating an alternating contrast IR image simulator for single detector scanning thermal cameras is reported. The principle of the simulator operation is pulsed excitation of positive luminescence and/or negative luminescence in a semiconductor (made of CdxHg1−xTe/CdTe varying-gap structures) within an interval not exceeding the duration of a single frame scan. The image is generated by temporally modulating the voltage applied to the semiconductor in synchronism with the camera frame. The simulator works at room temperature over the spectral range λ⩽7.5 μ m. It is characterised by a large emitting area and high speed and within a single frame can simulate positive, negative or alternate contrast images over the apparent temperature range ΔTapp=−43 to 110 °C with respect to background temperatures T≈300 K." @default.
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- W2061336369 date "2004-07-01" @default.
- W2061336369 modified "2023-09-23" @default.
- W2061336369 title "Alternate contrast pixel-less IR image simulator" @default.
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- W2061336369 doi "https://doi.org/10.1016/j.infrared.2003.11.007" @default.
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