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- W2061650963 abstract "Al-3% Cu stripes are powered in situ in the transmission electron microscope in order to study the effect of copper on the mechanisms of failure due to electro-migration. Consideration is given to the effects of various heat treatments and the depletion of Cu in the damage zone." @default.
- W2061650963 created "2016-06-24" @default.
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- W2061650963 date "1971-03-01" @default.
- W2061650963 modified "2023-09-26" @default.
- W2061650963 title "Electromigration Damage in Al-Cu Thin Films" @default.
- W2061650963 doi "https://doi.org/10.1109/irps.1971.362506" @default.
- W2061650963 hasPublicationYear "1971" @default.
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