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• W2061664657 abstract "In this review paper, we present the basic features of scanning tunneling microscopy and spectroscopy and describe some illustrative applications on local characterization of clean semiconductor surfaces and metal overlayers on reconstructed silicon surfaces." @default.
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• W2061664657 date "1988-01-01" @default.
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• W2061664657 title "Scanning tunneling microscopy (S.T.M.) of semiconductor surfaces and metal-semiconductor interfaces" @default.
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• W2061664657 doi "https://doi.org/10.1051/anphys:01988001303013300" @default.
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