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• W2061779996 abstract "Abstract The strain rate controlled nanoindentation was performed in c‐plane (0001) and m‐plane (10–10) GaN crystals. The indentation velocity was ranged from 0.16 to 800 nm/s. The significant displacement bursts were detected after every perfect elastically deformations and they allowed us to calculate the maximum shear stress τ max . The τ max dependences on strain rate in two crystal orientations involved that the two perpendicular compressions induced the same plastic deformation mechanism. Comparing the obtained τ max with the Peierls potential and maximum shear stress in each slip system, {10–11} 〈11–20〉 dislocation nucleation may support the origin of the plastic deformation in GaN crystal. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)" @default.
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• W2061779996 date "2011-01-10" @default.
• W2061779996 modified "2023-09-26" @default.
• W2061779996 title "Yield shear stress dependence on nanoindentation strain rate in bulk GaN crystal" @default.
• W2061779996 doi "https://doi.org/10.1002/pssc.201000604" @default.
• W2061779996 hasPublicationYear "2011" @default.
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