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- W2063133045 abstract "The microstructure of an epitaxial PbTiO 3 thick film was investigated by using transmission electron microscopy (TEM). An analysis of bright-field TEM (BFTEM) images revealed the existence of displacements along the [00 direction of PbTiO 3 . High-resolution TEM (HRTEM) observation indicated that stacking faults parallel to the (001) plane of PbTiO 3 are formed in the thick film. Local strain fields around the stacking faults were quantified by geometric phase analysis of the HRTEM image. The measured strain suggested the presence of a pair of extrinsic and intrinsic stacking faults. The distance between an extrinsic stacking fault and an intrinsic one corresponds to two unit cells along the [00 direction of PbTiO 3 . The formation of these stacking faults is considered to be associated with the strain relaxation of the film." @default.
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- W2063133045 date "2013-07-01" @default.
- W2063133045 modified "2023-09-28" @default.
- W2063133045 title "Analysis of Lattice Defects in an Epitaxial PbTiO<sub>3</sub> Thick Film by Transmission Electron Microscopy" @default.
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- W2063133045 doi "https://doi.org/10.4028/www.scientific.net/kem.566.171" @default.
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