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• W2063691185 abstract "We present a semi-analytical model for the description of charge trapping and detrapping phenomena occurring during cycling and idle periods in NAND Flash memories. The model is based on a statistical distribution of detrapping time constants that is affected by the composition of cycles and idle periods and accounts for charge discreteness, statistical charge capture and emission and statistical distribution of the threshold-voltage shift due to single detrapping events. The model can reproduce the experimental data under different conditions and allows to develop and monitor accelerated schemes able to mimic realistic on-field usage of the memory device." @default.
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• W2063691185 date "2014-06-01" @default.
• W2063691185 modified "2023-09-27" @default.
• W2063691185 title "A new spectral approach to modeling charge trapping/detrapping in NAND Flash memories" @default.
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• W2063691185 doi "https://doi.org/10.1109/irps.2014.6860600" @default.
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