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- W2063859595 abstract "We investigated the characteristic molecular secondary ion emission from polymer surfaces under 10 keV Ar+, Xe+ and SF+5 bombardment. Secondary ion yields of PET, PP, PTFE, PS, PC, PMMA and PEG were determined under static SIMS conditions. Damage cross sections were measured for PS and PC. We applied a time-of-flight mass spectrometer, equipped with a pulsed EI-source allowing the application of mass separated primary ion beams. Spin coated multilayers as well as surfaces of bulk polymers have been studied. Changing from Ar+ to Xe+ and to SF+5 bombardment we found a strong increase of the yield Y (up to a factor of 1000) and a much smaller increase in the corresponding damage cross sections σ (up to a factor of 6) for characteristic molecular secondary ions. Both effects are more pronounced in the high mass range. The corresponding increases in secondary ion formation efficiencies ranges between a factor of 5 and 50, depending on the polymer species, the sample preparation and the mass range. Preliminary results for monomolecular overlayers on Ag and Si indicate a similar behaviour of their characteristic secondary ion emission." @default.
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- W2063859595 date "1998-05-01" @default.
- W2063859595 modified "2023-10-15" @default.
- W2063859595 title "Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment" @default.
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- W2063859595 doi "https://doi.org/10.1016/s0169-4332(97)00515-1" @default.
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