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- W2064750167 abstract "In this paper we present unified models for the main noise contributions of the MOSFET drain current spectral density: the flicker noise and the thermal noise. The new noise model is consistent with a unified drain current model. All equations present an infinite order of continuity through all operating regimes. This makes the model very useful to study the noise in analog circuits, especially in low-power applications." @default.
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- W2064750167 date "1997-01-01" @default.
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- W2064750167 title "Unified noise MOSFET modeling" @default.
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- W2064750167 doi "https://doi.org/10.1088/0031-8949/1997/t69/033" @default.
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