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• W2065891034 abstract "Dielectric breakdown is a well documented phenomenon studied for logic transistors using SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> /SiON and HfO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> as the oxide material with thickness ranging from 1-5 nm. Recovery of dielectric breakdown has also been reported recently and its implications on the prolonged time dependent dielectric breakdown (TDDB) lifetime are very significant. Similarly, in the non-volatile memory arena, orders of magnitude change in conductance of the oxide has been observed for different voltage levels, voltage polarities and current densities, which is commonly referred to as “resistive switching”. Interestingly, although the gate stacks used for logic and memory applications are very similar in the materials used and dimensions as well, the mechanisms postulated to explain the breakdown-recovery mechanism in logic and switching mechanism in memory are very different. Often, the mechanism underlying switching tends to be very speculative without any convincing physical and electrical evidence that confirms the underlying kinetics of the reversible conductance state transition process. The issue stems from the fact that researchers in logic and memory operate in two distinct domains and seldom interact with each other and as a result, the link between the devices used for these two applications is not clearly recognized by most scientists. In this study, we will bridge the gap between these two phenomena and take advantage of our understanding of dielectric breakdown and recovery to convincingly explain the fundamental physics governing the switching process." @default.
• W2065891034 created "2016-06-24" @default.
• W2065891034 creator A5025103901 @default.
• W2065891034 creator A5034793030 @default.
• W2065891034 creator A5064500828 @default.
• W2065891034 creator A5073721593 @default.
• W2065891034 creator A5074170951 @default.
• W2065891034 date "2012-10-01" @default.
• W2065891034 modified "2023-09-26" @default.
• W2065891034 title "Dielectric breakdown &#x2014; Recovery in logic and resistive switching in memory &#x2014; Bridging the gap between the two phenomena" @default.
• W2065891034 cites W1969583784 @default.
• W2065891034 cites W1980042234 @default.
• W2065891034 cites W1980541035 @default.
• W2065891034 cites W1987079042 @default.
• W2065891034 cites W1989084029 @default.
• W2065891034 cites W2019912636 @default.
• W2065891034 cites W2053674573 @default.
• W2065891034 cites W2073363339 @default.
• W2065891034 cites W2074357625 @default.
• W2065891034 cites W2108949129 @default.
• W2065891034 cites W2112181056 @default.
• W2065891034 cites W2114108612 @default.
• W2065891034 cites W2122193720 @default.
• W2065891034 cites W2129989771 @default.
• W2065891034 cites W2141800017 @default.
• W2065891034 cites W2142372652 @default.
• W2065891034 cites W2145219801 @default.
• W2065891034 cites W2147762474 @default.
• W2065891034 cites W2147842458 @default.
• W2065891034 cites W2158676067 @default.
• W2065891034 cites W2164902965 @default.
• W2065891034 cites W2544251538 @default.
• W2065891034 doi "https://doi.org/10.1109/icsict.2012.6467690" @default.
• W2065891034 hasPublicationYear "2012" @default.
• W2065891034 type Work @default.
• W2065891034 sameAs 2065891034 @default.
• W2065891034 citedByCount "2" @default.
• W2065891034 countsByYear W20658910342014 @default.
• W2065891034 crossrefType "proceedings-article" @default.
• W2065891034 hasAuthorship W2065891034A5025103901 @default.
• W2065891034 hasAuthorship W2065891034A5034793030 @default.
• W2065891034 hasAuthorship W2065891034A5064500828 @default.
• W2065891034 hasAuthorship W2065891034A5073721593 @default.
• W2065891034 hasAuthorship W2065891034A5074170951 @default.
• W2065891034 hasConcept C119599485 @default.
• W2065891034 hasConcept C121332964 @default.
• W2065891034 hasConcept C121932024 @default.
• W2065891034 hasConcept C127413603 @default.
• W2065891034 hasConcept C131017901 @default.
• W2065891034 hasConcept C133386390 @default.
• W2065891034 hasConcept C152909973 @default.
• W2065891034 hasConcept C165801399 @default.
• W2065891034 hasConcept C166972891 @default.
• W2065891034 hasConcept C172385210 @default.
• W2065891034 hasConcept C174348530 @default.
• W2065891034 hasConcept C177950962 @default.
• W2065891034 hasConcept C191897082 @default.
• W2065891034 hasConcept C192562407 @default.
• W2065891034 hasConcept C2361726 @default.
• W2065891034 hasConcept C26873012 @default.
• W2065891034 hasConcept C2779851234 @default.
• W2065891034 hasConcept C31258907 @default.
• W2065891034 hasConcept C41008148 @default.
• W2065891034 hasConcept C49040817 @default.
• W2065891034 hasConcept C70401718 @default.
• W2065891034 hasConceptScore W2065891034C119599485 @default.
• W2065891034 hasConceptScore W2065891034C121332964 @default.
• W2065891034 hasConceptScore W2065891034C121932024 @default.
• W2065891034 hasConceptScore W2065891034C127413603 @default.
• W2065891034 hasConceptScore W2065891034C131017901 @default.
• W2065891034 hasConceptScore W2065891034C133386390 @default.
• W2065891034 hasConceptScore W2065891034C152909973 @default.
• W2065891034 hasConceptScore W2065891034C165801399 @default.
• W2065891034 hasConceptScore W2065891034C166972891 @default.
• W2065891034 hasConceptScore W2065891034C172385210 @default.
• W2065891034 hasConceptScore W2065891034C174348530 @default.
• W2065891034 hasConceptScore W2065891034C177950962 @default.
• W2065891034 hasConceptScore W2065891034C191897082 @default.
• W2065891034 hasConceptScore W2065891034C192562407 @default.
• W2065891034 hasConceptScore W2065891034C2361726 @default.
• W2065891034 hasConceptScore W2065891034C26873012 @default.
• W2065891034 hasConceptScore W2065891034C2779851234 @default.
• W2065891034 hasConceptScore W2065891034C31258907 @default.
• W2065891034 hasConceptScore W2065891034C41008148 @default.
• W2065891034 hasConceptScore W2065891034C49040817 @default.
• W2065891034 hasConceptScore W2065891034C70401718 @default.
• W2065891034 hasLocation W20658910341 @default.
• W2065891034 hasOpenAccess W2065891034 @default.
• W2065891034 hasPrimaryLocation W20658910341 @default.
• W2065891034 hasRelatedWork W1954343641 @default.
• W2065891034 hasRelatedWork W1975714547 @default.
• W2065891034 hasRelatedWork W2003743443 @default.
• W2065891034 hasRelatedWork W2030607485 @default.
• W2065891034 hasRelatedWork W2031401740 @default.
• W2065891034 hasRelatedWork W2114842981 @default.
• W2065891034 hasRelatedWork W2543883562 @default.
• W2065891034 hasRelatedWork W2546473172 @default.
• W2065891034 hasRelatedWork W3160961382 @default.
• W2065891034 hasRelatedWork W3209083003 @default.
• W2065891034 isParatext "false" @default.

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