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- W2065948615 abstract "A realistic and accurate computer method for high frequency numerical analysis under small signal conditions of a double avalanche region (DAR) (n+p nu np+) IMPATT diode is described. The method is used to determine microwave properties of several silicon DAR diodes under various operating conditions. The results indicate the existence of discrete and widely separated negative conductance bands in the DAR diode which can provide selective tuning in addition to wide frequency coverage for the device. The magnitude of DAR negative conductance, which is found to be smaller by an order of magnitude than that for the corresponding double drift diode, can be enhanced by the introduction of suitable asymmetry in the doping concentration of n and p of the DAR diode structure. The common drift layer for both types of charge carriers in the case of a DAR diode would result in space charge wave cancellation which may make it possible to push the input current to a high value and reduce the noise generation. Thus, a DAR diode may provide an appreciable amount of microwave power with low noise level over several frequency bands covering a wide frequency range." @default.
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- W2065948615 date "1991-08-01" @default.
- W2065948615 modified "2023-09-27" @default.
- W2065948615 title "High frequency numerical analysis of double avalanche region IMPATT diode" @default.
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- W2065948615 doi "https://doi.org/10.1088/0268-1242/6/8/011" @default.
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