Matches in SemOpenAlex for { <https://semopenalex.org/work/W2066789275> ?p ?o ?g. }
- W2066789275 endingPage "4129" @default.
- W2066789275 startingPage "4122" @default.
- W2066789275 abstract "We present experimental evidence of single-event upsets in 28 and 45 nm CMOS SRAMs produced by single energetic electrons. Upsets are observed within 10% of nominal supply voltage for devices built in the 28 nm technology node. Simulation results provide supporting evidence that upsets are produced by energetic electrons generated by incident X-rays. The observed errors are shown not to be the result of “weak bits” or photocurrents resulting from the collective energy deposition from X-rays. Experimental results are consistent with the bias sensitivity of critical charge for direct ionization effects caused by low-energy protons and muons in these technologies. Monte Carlo simulations show that the contributions of electron-induced SEU to error rates in the GEO environment depend exponentially on critical charge." @default.
- W2066789275 created "2016-06-24" @default.
- W2066789275 creator A5004218579 @default.
- W2066789275 creator A5005858344 @default.
- W2066789275 creator A5007928245 @default.
- W2066789275 creator A5009983855 @default.
- W2066789275 creator A5013185780 @default.
- W2066789275 creator A5018579479 @default.
- W2066789275 creator A5019687260 @default.
- W2066789275 creator A5021780363 @default.
- W2066789275 creator A5023938888 @default.
- W2066789275 creator A5024752318 @default.
- W2066789275 creator A5028702126 @default.
- W2066789275 creator A5032514251 @default.
- W2066789275 creator A5032901314 @default.
- W2066789275 creator A5034871394 @default.
- W2066789275 creator A5035965053 @default.
- W2066789275 creator A5047719101 @default.
- W2066789275 creator A5049822123 @default.
- W2066789275 creator A5053324780 @default.
- W2066789275 creator A5060521260 @default.
- W2066789275 creator A5071071155 @default.
- W2066789275 creator A5075487517 @default.
- W2066789275 creator A5075621565 @default.
- W2066789275 creator A5083591096 @default.
- W2066789275 date "2013-12-01" @default.
- W2066789275 modified "2023-09-26" @default.
- W2066789275 title "Electron-Induced Single-Event Upsets in Static Random Access Memory" @default.
- W2066789275 cites W1534121900 @default.
- W2066789275 cites W1965650510 @default.
- W2066789275 cites W1982430840 @default.
- W2066789275 cites W2024177677 @default.
- W2066789275 cites W2032512814 @default.
- W2066789275 cites W2045348865 @default.
- W2066789275 cites W2083683779 @default.
- W2066789275 cites W2086693906 @default.
- W2066789275 cites W2089462938 @default.
- W2066789275 cites W2102413175 @default.
- W2066789275 cites W2108032769 @default.
- W2066789275 cites W2108730429 @default.
- W2066789275 cites W2111226693 @default.
- W2066789275 cites W2122954231 @default.
- W2066789275 cites W2124869915 @default.
- W2066789275 cites W2128158076 @default.
- W2066789275 cites W2135961721 @default.
- W2066789275 cites W2139155477 @default.
- W2066789275 cites W2140061308 @default.
- W2066789275 cites W2148186459 @default.
- W2066789275 cites W2153304532 @default.
- W2066789275 cites W2153749460 @default.
- W2066789275 cites W2160642636 @default.
- W2066789275 cites W2168860942 @default.
- W2066789275 cites W2169258471 @default.
- W2066789275 doi "https://doi.org/10.1109/tns.2013.2286523" @default.
- W2066789275 hasPublicationYear "2013" @default.
- W2066789275 type Work @default.
- W2066789275 sameAs 2066789275 @default.
- W2066789275 citedByCount "58" @default.
- W2066789275 countsByYear W20667892752014 @default.
- W2066789275 countsByYear W20667892752015 @default.
- W2066789275 countsByYear W20667892752016 @default.
- W2066789275 countsByYear W20667892752017 @default.
- W2066789275 countsByYear W20667892752018 @default.
- W2066789275 countsByYear W20667892752019 @default.
- W2066789275 countsByYear W20667892752020 @default.
- W2066789275 countsByYear W20667892752021 @default.
- W2066789275 countsByYear W20667892752023 @default.
- W2066789275 crossrefType "journal-article" @default.
- W2066789275 hasAuthorship W2066789275A5004218579 @default.
- W2066789275 hasAuthorship W2066789275A5005858344 @default.
- W2066789275 hasAuthorship W2066789275A5007928245 @default.
- W2066789275 hasAuthorship W2066789275A5009983855 @default.
- W2066789275 hasAuthorship W2066789275A5013185780 @default.
- W2066789275 hasAuthorship W2066789275A5018579479 @default.
- W2066789275 hasAuthorship W2066789275A5019687260 @default.
- W2066789275 hasAuthorship W2066789275A5021780363 @default.
- W2066789275 hasAuthorship W2066789275A5023938888 @default.
- W2066789275 hasAuthorship W2066789275A5024752318 @default.
- W2066789275 hasAuthorship W2066789275A5028702126 @default.
- W2066789275 hasAuthorship W2066789275A5032514251 @default.
- W2066789275 hasAuthorship W2066789275A5032901314 @default.
- W2066789275 hasAuthorship W2066789275A5034871394 @default.
- W2066789275 hasAuthorship W2066789275A5035965053 @default.
- W2066789275 hasAuthorship W2066789275A5047719101 @default.
- W2066789275 hasAuthorship W2066789275A5049822123 @default.
- W2066789275 hasAuthorship W2066789275A5053324780 @default.
- W2066789275 hasAuthorship W2066789275A5060521260 @default.
- W2066789275 hasAuthorship W2066789275A5071071155 @default.
- W2066789275 hasAuthorship W2066789275A5075487517 @default.
- W2066789275 hasAuthorship W2066789275A5075621565 @default.
- W2066789275 hasAuthorship W2066789275A5083591096 @default.
- W2066789275 hasConcept C105795698 @default.
- W2066789275 hasConcept C121332964 @default.
- W2066789275 hasConcept C127413603 @default.
- W2066789275 hasConcept C145148216 @default.
- W2066789275 hasConcept C147120987 @default.
- W2066789275 hasConcept C184779094 @default.
- W2066789275 hasConcept C185544564 @default.