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- W2067069407 abstract "This paper discusses the effects of microtopographical structures on the Auger electron spectroscopic (AES) depth profiles of porous Al anodic oxides. In addition to a shadowing effect, the microtopographical structures in the oxide are responsible for a number of complications in the analysis, e.g., (1) reduction of Auger signal amplitude, (2) change of depth scale, (3) degradation of depth resolution (broadening effect), and (4) complicated change of surface topography during ion sputtering. The morphology of the oxide surface before and after ion sputtering was studied by means of a high resolution scanning transmission electron microscope (STEM), and the result was correlated with the AES profile data to make a rational interpretation of the profiles of Al, O, Ar, Cu and P in the anodic films of 2024 Al alloy formed in H3PO4 solutions. The effect of electron beam is also discussed." @default.
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- W2067069407 date "1980-08-01" @default.
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- W2067069407 title "Interpretation of AES depth profiles of porous Al anodic oxides" @default.
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- W2067069407 doi "https://doi.org/10.1016/0378-5963(80)90105-1" @default.
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