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• W2067635980 abstract "Thin films of LaNi5 were prepared by means of flash evaporation-deposition. The electrical resistivity of the films was measured in a hydrogen atmosphere. The films formed on the quartz substrates were amorphous. The resistivities of the films first increased and then decreased during the absorption of hydrogen. The reverse phenomenon was observed during the desorption process. The effect of the film thickness on the electrical properties during the hydrogen absorption-desorption process was also studied. Sample pulverization could be avoided by using a film less than 10 μm thick. The hydrogen content in the film was determined using the quartz crystal mass monitoring method." @default.
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• W2067635980 date "1985-06-01" @default.
• W2067635980 modified "2023-10-10" @default.
• W2067635980 title "Preparation of LaNi5 films and their electrical properties under a hydrogen atmosphere" @default.
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• W2067635980 doi "https://doi.org/10.1016/0022-5088(85)90435-7" @default.
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