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- W2068332337 abstract "Built-in test circuitry is proposed that uses the dynamic supply current consumption of a mixed signal circuit under test for a unified fault detection method. Simulation waveform are reported to illustrate the performance of the proposed circuitry." @default.
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- W2068332337 date "1994-03-17" @default.
- W2068332337 modified "2023-10-01" @default.
- W2068332337 title "Dynamic Idd test circuit for mixed signal ICs" @default.
- W2068332337 doi "https://doi.org/10.1049/el:19940343" @default.
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