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- W2068340717 abstract "Based on numerical simulation and comparison with measured current characteristics, we show that the current in InGaN/GaN single-quantum-well light-emitting diodes at low forward bias can be accurately described by a standard trap-assisted tunneling model. The qualitative and quantitative differences in the current characteristics of devices with different emission wavelengths are demonstrated to be correlated in a physically consistent way with the tunneling model parameters." @default.
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- W2068340717 date "2014-09-29" @default.
- W2068340717 modified "2023-10-16" @default.
- W2068340717 title "Trap-assisted tunneling in InGaN/GaN single-quantum-well light-emitting diodes" @default.
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- W2068340717 doi "https://doi.org/10.1063/1.4896970" @default.
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