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- W2068803249 abstract "Click to increase image sizeClick to decrease image sizeKey Words: Attribute samplingSingle sampling planVisual inspectionHuman factors Additional informationNotes on contributorsAnand K. GramopadhyeAbout the Authors: Anand K. Gramopadhye is an assistant professor of industrial engineering at Clemson University. He is a member of ASQC, IIE, and the Human Factors and Ergonomics Society. His research interests are concentrated in the area of modeling humans in quality and process control system, visual inspection, and training.Venu Gopal PajjuriVenu Gopal Pajjuri is a graduate student pursuing his master's degree in industrial engineering at Clemson University. He received his B.S. in mechanical engineering from Venkateswara University, India.Delbert KimblerDelbert L. Kimbler, P.E. is a professor of industrial engineering at Clemson University. He is a senior member of ASQC and IIE. His research in quality is primarily in design for quality and manufacturing process control.William G. FerrellWilliam G. Ferrell, Jr., is an associate professor of industrial engineering at Clemson University. His research interests are centered on quality engineering and system control with a quality-oriented objective." @default.
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- W2068803249 date "1995-12-01" @default.
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- W2068803249 title "Compensating for Inspection Errors in Attribute Inspection" @default.
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