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• W2068999711 abstract "The susceptibility of SRAM-based FPGAs to soft errors has shown to increase with technology scaling due to the reduction of transistor size and reduced voltage supply. This work presents the actual impact of voltage reductions in the vulnerability of SRAM-based FPGAs to neutron-induced soft errors in terms of static and dynamic cross-sections. Experimental results under neutron radiation exposure show that for a 45nm SRAM-based FPGA, a 19% reduction in the VDD supply voltage can result in a 92% higher cross-section." @default.
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• W2068999711 date "2013-09-01" @default.
• W2068999711 modified "2023-09-24" @default.
• W2068999711 title "Analyzing the influence of voltage scaling for soft errors in SRAM-based FPGAs" @default.
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• W2068999711 doi "https://doi.org/10.1109/radecs.2013.6937403" @default.
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