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- W2069365551 abstract "Abstract In this paper we detail the consequences of hot-carrier effects on the performance of a 64 Mb DRAM, by investigating the performance degradation of each constituent circuit on the overall performance of the part. This contrasts to the more traditional approach of measuring component transistor aging and applying an arbitrarily derived acceptable drift limit. The mechanism of overall circuit aging, how it relates to the degradation of individual transistor aging and which transistors are most critical to overall DRAM performance is discussed. It was found that hot-carrier-induced transistor aging of the circuit block does not directly affect speed degradation; however, it does seriously reduce the design margin of the analog circuit components of a DRAM. The circuit performance degradation caused by hot-carrier stress depends more on the circuit structure including the output loading conditions than on the absolute voltage level. On-chip hot-carrier stress/test patterns were also used to investigate the influence of output loads of inverter on dynamic hot-carrier degradation. It was found that the transistor in inverter driving a heavy output load showed less degradation than a comparable transistor in inverter driving a smaller load." @default.
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- W2069365551 title "Analysis of circuit degradation due to hot-carrier effects in 64Mb DRAMs" @default.
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- W2069365551 doi "https://doi.org/10.1016/0038-1101(96)00062-7" @default.
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