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• W2070254714 abstract "The film thickness (20–200 nm) dependence of the crystalline structure, lattice parameters and electrical properties of highly strained Pb(Zr,Ti)O 3 (PZT) thin films on MgO(100) was investigated. The PZT films were practically c -axis orientation. As the film thickness decreased (< 100 nm), the tetragonality ratio of PZT also decreased owing to the inner expanding strain in the in-plane direction. The dielectric constant decreased and the structural phase transition temperature shifted to a lower temperature corresponding with the decrease in the tetragonality ratio. The electric displacement-electric field ( D - E ) hysteresis curves for the thick (> 40 nm) films exhibited a certain amount of remanent polarization in the in-plane direction, implying the formation of a -domains. The relationship between electrical properties and the inner strain is discussed." @default.
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• W2070254714 date "1999-09-01" @default.
• W2070254714 modified "2023-09-25" @default.
• W2070254714 title "Electrical Properties of Highly Strained Epitaxial Pb(Zr,Ti)O₃ Thin Films on MgO(100)" @default.
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• W2070254714 doi "https://doi.org/10.1143/jjap.38.5388" @default.
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