Matches in SemOpenAlex for { <https://semopenalex.org/work/W2070552259> ?p ?o ?g. }
- W2070552259 endingPage "1344" @default.
- W2070552259 startingPage "1329" @default.
- W2070552259 abstract "This paper presents an overview of yield, reliability, burn-in, cost factors, and fault coverage as practiced in the semiconductor manufacturing industry. Reliability and yield modeling can be used as a foundation for developing effective stress burn-in, which in turn can warranty high-quality semiconductor products. Yield models are described and their advantages and disadvantages are discussed. Both yield reliability relationships and relation models between yield and reliability are thoroughly analyzed in regard to their importance to semiconductor products." @default.
- W2070552259 created "2016-06-24" @default.
- W2070552259 creator A5078941517 @default.
- W2070552259 creator A5084473082 @default.
- W2070552259 date "1999-01-01" @default.
- W2070552259 modified "2023-10-01" @default.
- W2070552259 title "An overview of manufacturing yield and reliability modeling for semiconductor products" @default.
- W2070552259 cites W1585205372 @default.
- W2070552259 cites W1623038198 @default.
- W2070552259 cites W175044245 @default.
- W2070552259 cites W1878376610 @default.
- W2070552259 cites W1965266460 @default.
- W2070552259 cites W1973239387 @default.
- W2070552259 cites W1976476558 @default.
- W2070552259 cites W1982978366 @default.
- W2070552259 cites W1983276518 @default.
- W2070552259 cites W1983485562 @default.
- W2070552259 cites W1983808249 @default.
- W2070552259 cites W1984480033 @default.
- W2070552259 cites W1988192422 @default.
- W2070552259 cites W1994368277 @default.
- W2070552259 cites W1998976901 @default.
- W2070552259 cites W2002945184 @default.
- W2070552259 cites W2016293885 @default.
- W2070552259 cites W2025631306 @default.
- W2070552259 cites W2027664892 @default.
- W2070552259 cites W2031457512 @default.
- W2070552259 cites W2041090186 @default.
- W2070552259 cites W2041319717 @default.
- W2070552259 cites W2044963087 @default.
- W2070552259 cites W2046045084 @default.
- W2070552259 cites W2051907727 @default.
- W2070552259 cites W2067171994 @default.
- W2070552259 cites W2069948346 @default.
- W2070552259 cites W2072045723 @default.
- W2070552259 cites W207911391 @default.
- W2070552259 cites W2081174345 @default.
- W2070552259 cites W2083238298 @default.
- W2070552259 cites W2101110957 @default.
- W2070552259 cites W2101340794 @default.
- W2070552259 cites W2101943127 @default.
- W2070552259 cites W2104898937 @default.
- W2070552259 cites W2104959457 @default.
- W2070552259 cites W2109983051 @default.
- W2070552259 cites W2118153635 @default.
- W2070552259 cites W2123663773 @default.
- W2070552259 cites W2128669863 @default.
- W2070552259 cites W2131198338 @default.
- W2070552259 cites W2132731035 @default.
- W2070552259 cites W2135552885 @default.
- W2070552259 cites W2140682638 @default.
- W2070552259 cites W2147148226 @default.
- W2070552259 cites W2149475789 @default.
- W2070552259 cites W2151128177 @default.
- W2070552259 cites W2152754258 @default.
- W2070552259 cites W2154784372 @default.
- W2070552259 cites W2155674764 @default.
- W2070552259 cites W2157937850 @default.
- W2070552259 cites W2159422884 @default.
- W2070552259 cites W2164470881 @default.
- W2070552259 cites W2170275739 @default.
- W2070552259 cites W2171874867 @default.
- W2070552259 cites W2543716337 @default.
- W2070552259 cites W3150723158 @default.
- W2070552259 cites W4205461305 @default.
- W2070552259 cites W4235806833 @default.
- W2070552259 cites W4242481154 @default.
- W2070552259 cites W4246492376 @default.
- W2070552259 cites W4251918988 @default.
- W2070552259 cites W4253843430 @default.
- W2070552259 doi "https://doi.org/10.1109/5.775417" @default.
- W2070552259 hasPublicationYear "1999" @default.
- W2070552259 type Work @default.
- W2070552259 sameAs 2070552259 @default.
- W2070552259 citedByCount "109" @default.
- W2070552259 countsByYear W20705522592012 @default.
- W2070552259 countsByYear W20705522592013 @default.
- W2070552259 countsByYear W20705522592014 @default.
- W2070552259 countsByYear W20705522592015 @default.
- W2070552259 countsByYear W20705522592016 @default.
- W2070552259 countsByYear W20705522592017 @default.
- W2070552259 countsByYear W20705522592018 @default.
- W2070552259 countsByYear W20705522592019 @default.
- W2070552259 countsByYear W20705522592020 @default.
- W2070552259 countsByYear W20705522592021 @default.
- W2070552259 countsByYear W20705522592022 @default.
- W2070552259 countsByYear W20705522592023 @default.
- W2070552259 crossrefType "journal-article" @default.
- W2070552259 hasAuthorship W2070552259A5078941517 @default.
- W2070552259 hasAuthorship W2070552259A5084473082 @default.
- W2070552259 hasConcept C111472728 @default.
- W2070552259 hasConcept C117671659 @default.
- W2070552259 hasConcept C119599485 @default.
- W2070552259 hasConcept C121332964 @default.
- W2070552259 hasConcept C127413603 @default.
- W2070552259 hasConcept C134121241 @default.
- W2070552259 hasConcept C138885662 @default.
- W2070552259 hasConcept C160671074 @default.