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- W2070996834 abstract "In thin metallic films, both surface and volume scattering of the conduction electrons (CEs) contribute to the resistivity. The electronic mean free path (MFP) therefore can be evaluated by a separation of these two scattering mechanisms. The authors discuss a new and simple method for this. Owing to enhanced surface scattering, coating of thin films leads to an increase in the resistivity. From the relative change in the resistance during coating at different temperatures the MFP of the CEs can be evaluated. Moreover, surface coating experiments combined with measurements of the thickness-dependent conductivity additionally provide accurate values of the electrical transport parameters in polycrystalline metals." @default.
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- W2070996834 date "1989-12-11" @default.
- W2070996834 modified "2023-09-23" @default.
- W2070996834 title "A new method for determining the electronic mean free path in polycrystalline metals" @default.
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