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- W2071548780 abstract "Experimental evidence concerning an influence of the in situ scraping process on the XPS core-level spectra of LiNbO3 and GaSb is reported. It proved high efficiency of this surface preparation method for extracting a bulk component of the XPS signal acquired from a crystal. In particular, two specific advantages of in situ scraping over a surface cleaning by Ar+ ion bombardment have been underlined. Firstly, complete removal of surface adsorbed species (carbon and oxygen) and of the surface oxides. Secondly, despite mechanical damage of the crystal surface, the in situ scraping does not introduce surface defects that could influence the bulk XPS core-level spectra of the compounds studied (especially LiNbO3). The bulk XPS data for GaSb, reported here, remain the first reference ones obtained with the use of this preparation method." @default.
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- W2071548780 date "1999-05-01" @default.
- W2071548780 modified "2023-09-28" @default.
- W2071548780 title "Application of in situ surface scraping for extracting bulk component of XPS signal – example of LiNbO3 and GaSb" @default.
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- W2071548780 doi "https://doi.org/10.1016/s0925-8388(98)01000-7" @default.
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