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- W2071640304 abstract "Abstract A new experimental method for identifying the chemical and structural nature of small inclusions imbedded in a SiO 2 matrix will be described. This technique combines the capabilities of transmission electron microscopy (TEM) and laser ablation microprobe mass spectrometry (LAMMS) to study the segregation and drift of B in SiO 2 . TEM and LAMMS were used to identify small (310–590 A) precipitates which did not dissolve in a HF etching solution making it possible to isolate them on a nitrocellulose carbon-coated electron microscope grid. The particles were identified by TEM and LAMMS as B-doped Si precipitates." @default.
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- W2071640304 date "1990-06-01" @default.
- W2071640304 modified "2023-09-24" @default.
- W2071640304 title "New technique for analyzing small inclusions using transmission electron microscopy and laser ablation microprobe mass spectrometry" @default.
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- W2071640304 doi "https://doi.org/10.1016/0167-577x(90)90071-s" @default.
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