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• W2071738982 startingPage "1490" @default.
• W2071738982 abstract "Vanadium pentoxide thin films of various thicknesses have been prepared by sol-gel spin coating method on glass and conducting substrates. X-ray diffraction analysis reveals crystalline nature for the 6–12 layered films (170–310 nm). The crystalline films indicate a preferential orientation of the crystallites along the (200) plane. FTIR studies of the V2O5 xerogel show the presence of V–O–V and V= O bond confirming the formation of V2O5. The scanning electron microscope images reveal formation of nanostructures in the 6–12 layered films. Optical absorption studies indicate a band gap of 2.2–2.5 eV. Pseudocapacitance behaviour of the V2O5 films was studied using cyclic voltammetric technique and impedance analysis. V2O5 films of thickness 202 nm (8 layers) exhibit a specific capacitance of 346 F/g at a scan rate of 5 mV/s." @default.
• W2071738982 created "2016-06-24" @default.
• W2071738982 creator A5020627146 @default.
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• W2071738982 date "2013-05-01" @default.
• W2071738982 modified "2023-10-16" @default.
• W2071738982 title "Thickness dependent supercapacitor behaviour of sol-gel spin coated nanostructured vanadium pentoxide thin films" @default.
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• W2071738982 doi "https://doi.org/10.1080/14786435.2012.745654" @default.
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