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- W2071844672 abstract "The early stages of epitaxy which determine to a large extent the later growth and the physical properties of epitaxial layers can be studied with a resolution of the order of 10 nm using slow electrons in a variety of structural, magnetic and chemical contrast modes. These imaging modes are described and their application illustrated by several case studies including Si homoepitaxy, metals on Si and metals on metals." @default.
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- W2071844672 date "1996-02-01" @default.
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- W2071844672 title "LEEM studies of the early stages of epitaxial growth" @default.
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- W2071844672 doi "https://doi.org/10.1016/0169-4332(95)00196-4" @default.
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