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- W2071853817 abstract "Device degradation due to hot-electron injection in n-channel MOSFET's is mainly caused by mobility degradation and reduced mobile charges in the channel introduced by interface-state generation. With the use of simple gradual-channel approximation (GCA), a linear relationship is derived between the threshold shift, relative transconductance reduction, and the number of interface states generated. This model provides a link between the electrical characteristics of a degraded device and its physical damages and, therefore, is a vital tool in the study of hot-electron-induced device degradation mechanisms." @default.
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- W2071853817 date "1984-02-01" @default.
- W2071853817 modified "2023-09-25" @default.
- W2071853817 title "Relationship between MOSFET degradation and hot-electron-induced interface-state generation" @default.
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- W2071853817 doi "https://doi.org/10.1109/edl.1984.25829" @default.
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