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- W207185879 abstract "The conventional bright field (Fig. 1a) and dark-field images of small (<200Å) def ects are beset with several disadvantages: The image sizes (≃300Å) are two or three times the defect size; the image shift from core position may be larger than the defects; (Table 1a); the images are dominated by strain field effects and give no clue to defect shape and habit. Conventional images are therefore unsuitable for the size, nature and habit plane determination of small defects." @default.
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- W207185879 date "1974-08-15" @default.
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- W207185879 title "Non-Conventional Electron Microscopy in Small Defect Characterization" @default.
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- W207185879 doi "https://doi.org/10.1017/s0424820100051785" @default.
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