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• W2072361520 abstract "Micro-Raman imaging has been used extensively for characterizing semiconductors. This paper reviews recent developments in the use of Raman microscopy for studying structural and electronic properties of semiconductor crystals and composites. Some results for recent Raman imaging measurements are outlined and discussed." @default.
• W2072361520 created "2016-06-24" @default.
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• W2072361520 date "2003-12-22" @default.
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• W2072361520 title "Raman imaging of semiconductor materials: characterization of static and dynamic properties" @default.
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• W2072361520 doi "https://doi.org/10.1088/0953-8984/16/2/004" @default.
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