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• W2072585943 abstract "A review is given of what has been learned from electron paramagnetic resonance (EPR) and localized vibrational mode (LVM) spectroscopy concerning isolated lattice vacancies and self-interstitials, and their interactions with other defects in silicon. This information can supply the basic tools with which to help unravel much of the complex processes and structures involved in crystal growth, device processing, and radiation damage." @default.
• W2072585943 created "2016-06-24" @default.
• W2072585943 creator A5021951883 @default.
• W2072585943 date "2000-08-01" @default.
• W2072585943 modified "2023-10-14" @default.
• W2072585943 title "Intrinsic defects in silicon" @default.
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• W2072585943 doi "https://doi.org/10.1016/s1369-8001(00)00037-8" @default.
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