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• W2072735697 startingPage "1628" @default.
• W2072735697 abstract "A general formula for the capacitance transient response in an MIS structure has been developed, including the continuous density distribution of interface states and discrete multi-impurity levels. A new method of spectroscopic measurement is proposed for determining the density distributions and capture cross-sections of interface states and bulk impurity levels under isothermal conditions. The method is then applied to an n-InAs/anodic oxide MIS diode." @default.
• W2072735697 created "2016-06-24" @default.
• W2072735697 creator A5048200181 @default.
• W2072735697 date "1982-11-01" @default.
• W2072735697 modified "2023-10-18" @default.
• W2072735697 title "Isothermal Capacitance Transient Spectroscopy in MIS Structures" @default.
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• W2072735697 doi "https://doi.org/10.1143/jjap.21.1628" @default.
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