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- W2072962323 abstract "The adhesion strength of sputtered aluminium films to XC 70 steel substrates has been studied using the scratch adhesion test. The influence of the application of a bias voltage on the substrate during deposition was investigated by means of a mean critical load derived from a Weibull-like statistical analysis. It was found that in the absence of bias, the interface is rather abrupt, while the interface obtained with the application of a bias voltage is much more diffuse. We can consider that the widening of the interfacial region offers a better film anchorage on its substrate, requiring a stylus load value clearly excessively high to produce an adhesion failure." @default.
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- W2072962323 date "1994-08-01" @default.
- W2072962323 modified "2023-09-25" @default.
- W2072962323 title "Adhesion studies of sputtered aluminium films on XC 70 steel substrates. Effect of the application of a bias voltage on the substrate during deposition" @default.
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- W2072962323 doi "https://doi.org/10.1016/0040-6090(94)90012-4" @default.
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