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• W2073597079 endingPage "9971" @default.
• W2073597079 startingPage "9968" @default.
• W2073597079 abstract "Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The imaging signal in this technique is the frequency shift $ensuremath{Delta}f$ of an oscillating cantilever with eigenfrequency ${f}_{0},$ spring constant k and amplitude A, which is subject to tip-sample forces ${F}_{mathrm{ts}}.$ Here, we present analytical results of $ensuremath{Delta}{f(f}_{0},k,A)$ for several basic classes of ${F}_{mathrm{ts}}.$ With these results, a method to calculate images is derived and demonstrated with an example." @default.
• W2073597079 created "2016-06-24" @default.
• W2073597079 creator A5007613203 @default.
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• W2073597079 date "2000-04-15" @default.
• W2073597079 modified "2023-10-16" @default.
• W2073597079 title "Physical interpretation of frequency-modulation atomic force microscopy" @default.
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• W2073597079 doi "https://doi.org/10.1103/physrevb.61.9968" @default.
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